SAN JOSE, Calif., March 27 /PRNewswire-FirstCall/ -- LogicVision, Inc. (NASDAQ: LGVND), a leading provider of semiconductor test and yield learning solutions, today announced that Saman Adham, a Sr. Director of Engineering at LogicVision has received the J.J. Archambault Easter Canada Merit Award for the conception, design, & operation of the webinar program of IEEE Canada. The award will be presented at the IEEE Canada Awards Banquet on the evening of May 5, 2008 in Niagara Falls during the 21st annual IEEE Canada Canadian Conference on Electrical and Computer Engineering (CCECE08).

Saman Adham has served on the IEEE Canada (Region 7) organization for the past 14 years. He has been an active participant at various levels and is currently the 2007- 2008 Education Activity Chair. He is an active participant in the Test Technology Technical Council (TTTC) and served as North America Region group vice chair in 2004. Dr. Adham established and currently chairs the IEEE P1450.6.2 working group standard to standardize the test views of semiconductor embedded memories.

"IEEE Canada is very pleased with the success of the web-based seminar program that was launched in 2007 by Dr. Adham," said Robert Hanna, IEEE Canada President (2006-2007). "Saman was instrumental in organizing and running these webinars. In recognition for his excellent services and dedication to IEEE Canada and the Engineering profession, IEEE Canada is very pleased to recognize Dr. Adham with this prestigious service award."

"Saman is a key member of LogicVision's engineering team and instrumental in establishing our leadership in the embedded test market," said Fadi Maamari, Vice President of Engineering at LogicVision. "It is great to see him recognized by his peers for his commitment and dedication to IEEE Canada's activities."

About LogicVision

LogicVision (NASDAQ: LGVND) provides proprietary technologies for embedded test and yield learning that enable more efficient manufacturing test of complex semiconductors. LogicVision's embedded test solutions allow integrated circuit designers to embed test functionality into a semiconductor design that is used during semiconductor production test and throughout the useful life of the chip. The company's advanced Design for Test (DFT) product line, ETCreate(TM), works together with Silicon Insight(TM) and Yield Insight(TM) applications to improve profit margins by reducing device field returns and test costs, accelerating silicon bring-up times and shortening both time to market and time to yield. For more information on the company and its products, please visit the LogicVision website at www.logicvision.com.

Web site: http://www.logicvision.com/