SAN JOSE, Calif., Aug. 11 /PRNewswire-FirstCall/ -- LogicVision, Inc. (NASDAQ: LGVN), a leading provider of semiconductor built-in-self-test (BIST) and diagnostic solutions, will present at the 4th Annual Technology Conference hosted by Security Research Associates at the Omni Hotel in San Francisco. Mr. James T. Healy, LogicVision's president and CEO, and Mr. Bruce M. Jaffe, LogicVision's chief financial officer, are scheduled to present on Monday, August 18, 2008. A webcast of the presentation will be available:

    Date:     Monday, August 18, 2008
    Time:     5:00 P.M. Eastern Time / 2:00 P.M. Pacific Time for the live
              presentation
    Location: On the web at http://investor.shareholder.com/lgvn/events.cfm
    Replay:   Available one hour after the presentation ends and accessible
              for 90 days.

About LogicVision, Inc.

LogicVision (NASDAQ: LGVN) provides proprietary technologies for embedded test and yield learning that enable more efficient manufacturing test of complex semiconductors. LogicVision's embedded test solutions allow integrated circuit designers to embed test functionality into a semiconductor design that is used during semiconductor production test and throughout the useful life of the chip. The company's advanced Design for Test (DFT) product line, ETCreate, works together with Silicon Insight applications and Yield Insight to improve profit margins by reducing device field returns and test costs, accelerating silicon bring-up times and shortening both time to market and time to yield. For more information on the company and its products, please visit the LogicVision website at www.logicvision.com.

Web site: http://www.logicvision.com/
http://investor.shareholder.com/lgvn/events.cfm/