ROCHESTER, NY – October 16, 2008 – Pictometry International Corp., a leading provider of geo-referenced aerial image libraries whose patented and proprietary technology is used globally to capture oblique image libraries, has selected RIT student Eugenie Song as the recipient of the Dr. Robert W. Loss Jr. Scholarship.

Song is a senior interning at RIT’s Center of Imaging Science . As the recipient of the Loss Scholarship, she with travel to San Antonio this month to attend Pictometry FutureView 2008, a conference dedicated to oblique aerial imaging technology. Special guest speaker for this year’s event is Don Cooke, Chief Scientist for Tele Atlas. The three-day conference features new innovations in oblique imagery as well as training events hosted by ESRI, NENA and IAAO.

“Pictometry is proud to offer this opportunity in memory of Dr. Loss,” said Pictometry’s Chief Marketing Officer Dante Pennacchia . “Bob Loss was a strong proponent of education and was passionately supportive of Pictometry. This opportunity gives a local student a rare opportunity to preview new innovations and interact with engineers and experts in the field.”

FutureView takes place Oct. 27-29 at the Marriott Rivercenter. For more information on the conference, visit www.pictometry.com.

About Pictometry

Pictometry International Corp. is a leading provider of geo-referenced, aerial image libraries and related software. Pictometry has captured over 50 million digital aerial images in over 600 counties in the United States covering over 70 percent of the United States population. Using its proprietary imaging process, Pictometry® captures geo-referenced, high-resolution oblique (at an angle, producing a 3-D like view) and orthogonal (straight down) Intelligent Images®, within which structures and land features can be measured. Pictometry customizes and markets these technologies for government and commercial applications, offering non-traditional software solutions to aerial imaging needs. Pictometry’s imagery and software enables users to “See Everywhere, Measure Anything, Plan Everything”® using a patented digital information system. Pictometry has its headquarters in Rochester , NY and an office in Europe . Pictometry is a second order visualization tool that does not produce authoritative or definitive information (surveying) from its digital, aerial images. For more information on Pictometry, visit www.pictometry.com.


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